I am measuring a feature type cloud and for access purposes, I will need to use two different tips (same probe assembly).  If I add a tip change inside the path screen midway through measuring the cloud, will the points after the tip change be tip compensated properly with the new tip? Or will the tip compensation still use the original tip at the beginning of the feature.

This question also would apply to using a star probe to measure a groove diameter with multiple tips.

If it does comp properly, are there any pitfalls to be aware of that should be known?

Thanks

J